Evaluation of Dislocation Densities in Various Microstructures of Additively Manufactured Ti6Al4V (Eli) by the Method of X-ray Diffraction

dc.contributor.authorMuiruri, Amos
dc.contributor.authorMaringa, Maina
dc.contributor.authorDu Preez, Willie
dc.date.accessioned2023-04-20T11:19:40Z
dc.date.available2023-04-20T11:19:40Z
dc.date.issued2020-11-26
dc.descriptionArticleen_US
dc.description.abstractDislocations play a central role in determining strength and flow properties of metals and alloys. Di usionless phase transformation of ! in Ti6Al4V during the Direct Metal Laser Sintering (DMLS) process produces martensitic microstructures with high dislocation densities. However, heat treatment, such as stress relieving and annealing, can be applied to reduce the volume of these dislocations. In the present study, an analysis of the X-ray di raction (XRD) profiles of the non-heat-treated and heat-treated microstructures of DMLS Ti6Al4V(ELI) was carried out to determine the level of defects in these microstructures. The modified Williamson–Hall and modified Warren–Averbach methods of analysis were used to evaluate the dislocation densities in these microstructures. The results obtained showed a 73% reduction of dislocation density in DMLS Ti6Al4V(ELI) upon stress relieving heat treatment. The density of dislocations further declined in microstructures that were annealed at elevated temperatures, with the microstructures that were heat-treated just below the ! recording the lowest dislocation densities.en_US
dc.identifier.otherdoi:10.3390/ma13235355
dc.identifier.urihttp://hdl.handle.net/11462/2446
dc.language.isoenen_US
dc.publisherMaterials 2020, 13, 5355en_US
dc.relation.ispartofseriesMaterials;2020, 13, 5355
dc.subjectDirectmetal laser sinteringen_US
dc.subjectTi6Al4V(ELI)en_US
dc.subjectMicrostructureen_US
dc.subjectX-ray diffractionen_US
dc.subjectDislocation densityen_US
dc.titleEvaluation of Dislocation Densities in Various Microstructures of Additively Manufactured Ti6Al4V (Eli) by the Method of X-ray Diffractionen_US
dc.typeArticleen_US

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